| Part Number: HSMS-2802A2 | Manufacturer: Avago Technologies U S Inc |
| NSN : 5961-01-484-1291 (5961014841291) | Item Name : semiconductordeviceset |
| CAGE Code: 50434 | FSC : 5961 Semiconductor Devices and Associated Hardware |
| Alternate P/N : HSMS2802A2 |
Would you like to obtain a quick quote for Avago Technologies U S Inc (Cage Code 50434) Part Number HSMS-2802A2, Semiconductordeviceset with NSN 5961014841291? it's just a few steps away! Simply complete the form in its entirety, and we will promptly reply with a quote within 15 minutes. This is an excellent opportunity to get the quick quote for HSMS-2802A2, so take advantage of it right away.
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| MRC | Criteria | Characteristic |
|---|---|---|
| ABHP | OVERALL LENGTH | 0.110 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.120 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE" |
| ABKW | OVERALL HEIGHT | 0.028 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.037 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE" |
| ABMK | OVERALL WIDTH | 0.047 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.055 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE" |
| AFZC | FUNCTION FOR WHICH DESIGNED | DETECTOR" |
| ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE" |
| AXGY | MOUNTING METHOD | TERMINAL ALL SEMICONDUCTOR DEVICE DIODE" |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE" |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 7.0 MINIMUM BREAKDOWN VOLTAGE, DC ALL SEMICONDUCTOR DEVICE DIODE" |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 1.00 AMPERES SOURCE CUTOFF CURRENT PRESET ALL SEMICONDUCTOR DEVICE DIODE" |
| CTRG | CAPACITANCE RATING IN PICOFARADS | 2.0 MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE" |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS JUNCTION ALL SEMICONDUCTOR DEVICE DIODE" |
| TTQY | TERMINAL TYPE AND QUANTITY | 3 PIN ALL SEMICONDUCTOR DEVICE DIODE" |
| ABHP | OVERALL LENGTH | 0.110 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.120 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE" |
| ABKW | OVERALL HEIGHT | 0.028 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.037 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE" |
| ABMK | OVERALL WIDTH | 0.047 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.055 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE" |
| AFZC | FUNCTION FOR WHICH DESIGNED | DETECTOR" |
| ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE" |
| AXGY | MOUNTING METHOD | TERMINAL ALL SEMICONDUCTOR DEVICE DIODE" |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE" |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 7.0 MINIMUM BREAKDOWN VOLTAGE, DC ALL SEMICONDUCTOR DEVICE DIODE" |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 1.00 AMPERES SOURCE CUTOFF CURRENT PRESET ALL SEMICONDUCTOR DEVICE DIODE" |
| CTRG | CAPACITANCE RATING IN PICOFARADS | 2.0 MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE" |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS JUNCTION ALL SEMICONDUCTOR DEVICE DIODE" |
| TTQY | TERMINAL TYPE AND QUANTITY | 3 PIN ALL SEMICONDUCTOR DEVICE DIODE" |
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