Part Number: JAN1N5809 | Manufacturer: Bae Systems Operations Limited Dba Bae Systems Plc |
NSN : 5961-01-053-2794 (5961010532794) | Item Name : semiconductor device diode |
CAGE Code: K0656 | FSC : 5961 Semiconductor Devices and Associated Hardware |
NIIN : 01-053-2794 (010532794) | FSG : 59 Electrical and Electronic Equipment Components |
Country: USA | NCB Code: 01 |
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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5961-01-053-2794 Item Description: Semiconductor Device Diode | 5961 | 010532794 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | B | A | ||||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
Jan1n5809 | 1 | 2 | 2 |
MRC | Criteria | Characteristic |
---|---|---|
DIODE | ABBH | INCLOSURE MATERIALGLASS |
DIODE | ABHP | OVERALL LENGTH0 130 INCHES MINIMUM AND 0 300 INCHES MAXIMUM |
DIODE | ADAV | OVERALL DIAMETER0 115 INCHES MINIMUM AND 0 165 INCHES MAXIMUM |
DIODE | AXGY | MOUNTING METHODTERMINAL |
DIODE | CTMZ | SEMICONDUCTOR MATERIALSILICON |
DIODE | CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC100 0 MAXIMUM WORKING PEAK REVERSE VOLTAGE |
DIODE | CTQX | CURRENT RATING PER CHARACTERISTIC125 00 AMPERES FORWARD CURRENT AVERAGE PRESET |
DIODE | CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT175 0 DEG CELSIUS JUNCTION |
DIODE | TEST | TEST DATA DOCUMENT81349-MIL-PRF-19500 SPECIFICATION INCLUDES ENGINEERING TYPE BULLETINS BROCHURESETC THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT EXCLUDES COMMERCIAL CATALOGS INDUSTRY DIRECTORIES AND SIMILAR TRADE PUBLICATIONS REFLEC |
DIODE | TTQY | TERMINAL TYPE AND QUANTITY2 UNINSULATED WIRE LEAD |
DIODE | ZZZK | SPECIFICATIONSTANDARD DATA81349-MIL-PRF-19500477 GOVERNMENT SPECIFICATION |
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